Introduction to Advanced System-on-Chip Test Design and Optimization

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automat...

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Main Author: Larsson, Erik
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston, MA Springer US 2005, 2005
Series:Frontiers in Electronic Testing
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Table of Contents:
  • Testing Concepts
  • Design Flow
  • Design for Test
  • Boundary Scan
  • SOC Design for Testability
  • System Modeling
  • Test Conflicts
  • Test Power Dissipation
  • Test Access Mechanism
  • Test Scheduling
  • SOC Test Applications
  • A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling
  • An Integrated Framework for the Design and Optimization of SOC Test Solutions
  • Efficient Test Solutions for Core-Based Designs
  • Core Selection in the SOC Test Design-Flow
  • Defect-Aware Test Scheduling
  • An Integrated Technique for Test Vector Selection and Test Scheduling under ATE Memory Depth Constraint