Introduction to Advanced System-on-Chip Test Design and Optimization

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automat...

Full description

Main Author: Larsson, Erik
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston, MA Springer US 2005, 2005
Series:Frontiers in Electronic Testing
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
LEADER 02769nmm a2200349 u 4500
001 EB000354092
003 EBX01000000000000000207144
005 00000000000000.0
007 cr|||||||||||||||||||||
008 130626 ||| eng
020 |a 9780387256245 
100 1 |a Larsson, Erik 
245 0 0 |a Introduction to Advanced System-on-Chip Test Design and Optimization  |h Elektronische Ressource  |c by Erik Larsson 
260 |a Boston, MA  |b Springer US  |c 2005, 2005 
300 |a XX, 388 p  |b online resource 
505 0 |a Testing Concepts -- Design Flow -- Design for Test -- Boundary Scan -- SOC Design for Testability -- System Modeling -- Test Conflicts -- Test Power Dissipation -- Test Access Mechanism -- Test Scheduling -- SOC Test Applications -- A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling -- An Integrated Framework for the Design and Optimization of SOC Test Solutions -- Efficient Test Solutions for Core-Based Designs -- Core Selection in the SOC Test Design-Flow -- Defect-Aware Test Scheduling -- An Integrated Technique for Test Vector Selection and Test Scheduling under ATE Memory Depth Constraint 
653 |a Optical and Electronic Materials 
653 |a Electronics and Microelectronics, Instrumentation 
653 |a Engineering 
653 |a Engineering design 
653 |a Electronic and Computer Engineering 
653 |a Electronics 
653 |a Optical materials 
653 |a Engineering Design 
710 2 |a SpringerLink (Online service) 
041 0 7 |a eng  |2 ISO 639-2 
989 |b Springer  |a Springer eBooks 2005- 
490 0 |a Frontiers in Electronic Testing 
856 |u http://dx.doi.org/10.1007/b135763?nosfx=y  |x Verlag  |3 Volltext 
082 0 |a 621.3 
520 |a SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process