Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing r...

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Bibliographic Details
Main Authors: Du, Xiong, Zhang, Jun (Author), Li, Gaoxian (Author), Yu, Yaoyi (Author)
Format: eBook
Language:English
Published: Singapore Springer Nature Singapore 2022, 2022
Edition:1st ed. 2022
Series:CPSS Power Electronics Series
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Table of Contents:
  • Introduction
  • Thermal fatigue failure mechanism of power devices in renewable energy system
  • Thermal model and thermal parameters monitoring
  • Thermal analysis of power semiconductor device in renewable energy system
  • Multi-time scale lifetime evaluation for the device in the renewable application
  • Thermal management design and optimization
  • Prospect