Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing r...

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Bibliographic Details
Main Authors: Du, Xiong, Zhang, Jun (Author), Li, Gaoxian (Author), Yu, Yaoyi (Author)
Format: eBook
Language:English
Published: Singapore Springer Nature Singapore 2022, 2022
Edition:1st ed. 2022
Series:CPSS Power Electronics Series
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Description
Summary:This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
Physical Description:XVI, 172 p. 121 illus., 94 illus. in color online resource
ISBN:9789811931321