Latest Advances in Electrothermal Models

This book is devoted to the latest advances in the area of electrothermal modelling of electronic components and networks. It contains eight sections by different teams of authors. These sections contain the results of: (a) electro-thermal simulations of SiC power MOSFETs using a SPICE-like simulati...

Full description

Bibliographic Details
Main Author: Górecki, Krzysztof
Other Authors: Górecki, Paweł
Format: eBook
Language:English
Published: Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2021
Subjects:
Bjt
Online Access:
Collection: Directory of Open Access Books - Collection details see MPG.ReNa
LEADER 03971nma a2200817 u 4500
001 EB001992365
003 EBX01000000000000001155267
005 00000000000000.0
007 cr|||||||||||||||||||||
008 210512 ||| eng
020 |a 9783036503349 
020 |a books978-3-0365-0335-6 
020 |a 9783036503356 
100 1 |a Górecki, Krzysztof 
245 0 0 |a Latest Advances in Electrothermal Models  |h Elektronische Ressource 
260 |a Basel, Switzerland  |b MDPI - Multidisciplinary Digital Publishing Institute  |c 2021 
300 |a 1 electronic resource (140 p.) 
653 |a thermal resistance 
653 |a transient thermal impedance 
653 |a finite-element method (FEM) 
653 |a algorithm convergence analysis 
653 |a inductors 
653 |a SPICE 
653 |a electrothermal model 
653 |a self-heating 
653 |a throughput improvement 
653 |a electrothermal (ET) simulation 
653 |a algorithm efficiency analysis 
653 |a modelling 
653 |a History of engineering and technology / bicssc 
653 |a finite difference method scheme 
653 |a model-order reduction (MOR) 
653 |a IGBT 
653 |a silicon carbide 
653 |a silicon carbide (SiC) 
653 |a DC-DC converter 
653 |a Grünwald-Letnikov fractional derivative 
653 |a multi-LED lighting modules 
653 |a relative error analysis 
653 |a thermal phenomena 
653 |a thermal simulation algorithm 
653 |a diode-transistor switch 
653 |a thermal model 
653 |a Dual-Phase-Lag heat transfer model 
653 |a temperature sensors 
653 |a Finite Difference Method scheme 
653 |a device thermal coupling 
653 |a Krylov subspace-based model order reduction 
653 |a ferromagnetic cores 
653 |a computational complexity analysis 
653 |a power electronics 
653 |a BJT 
653 |a microprocessor 
653 |a multicellular power MOSFET 
653 |a thermal measurements 
653 |a averaged model 
653 |a compact thermal models 
700 1 |a Górecki, Paweł 
700 1 |a Górecki, Krzysztof 
700 1 |a Górecki, Paweł 
041 0 7 |a eng  |2 ISO 639-2 
989 |b DOAB  |a Directory of Open Access Books 
500 |a Creative Commons (cc), https://creativecommons.org/licenses/by/4.0/ 
024 8 |a 10.3390/books978-3-0365-0335-6 
856 4 2 |u https://directory.doabooks.org/handle/20.500.12854/68490  |z DOAB: description of the publication 
856 4 0 |u https://www.mdpi.com/books/pdfview/book/3510  |7 0  |x Verlag  |3 Volltext 
082 0 |a 900 
082 0 |a 000 
082 0 |a 600 
082 0 |a 620 
520 |a This book is devoted to the latest advances in the area of electrothermal modelling of electronic components and networks. It contains eight sections by different teams of authors. These sections contain the results of: (a) electro-thermal simulations of SiC power MOSFETs using a SPICE-like simulation program; (b) modelling thermal properties of inductors taking into account the influence of the core volume on the efficiency of heat removal; (c) investigations into the problem of inserting a temperature sensor in the neighbourhood of a chip to monitor its junction temperature; (d) computations of the internal temperature of power LEDs situated in modules containing multiple-power LEDs, taking into account both self-heating in each power LED and mutual thermal couplings between each diode; (e) analyses of DC-DC converters using the electrothermal averaged model of the diode-transistor switch, including an IGBT and a rapid-switching diode; (f) electrothermal modelling of SiC power BJTs; (g) analysis of the efficiency of selected algorithms used for solving heat transfer problems at nanoscale; (h) analysis related to thermal simulation of the test structure dedicated to heat-diffusion investigation at the nanoscale.