MPG.eBooks - Table of Contents: Test Generation of Crosstalk Delay Faults in VLSI Circuits

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Test Generation of Crosstalk Delay Faults in VLSI Circuits

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on cu...

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Bibliographic Details
Main Authors:	Jayanthy, S., Bhuvaneswari, M.C. (Author)
Format:	eBook
Language:	English
Published:	Singapore Springer Nature Singapore 2019, 2019
Edition:	1st ed. 2019
Subjects:	Microprogramming Hardware Performance And Reliability Computers Control Structures And Microprogramming Electronic Circuits Logic Design Electronic Circuits And Systems
Online Access:	https://doi.org/10.1007/978-981-13-2493-2?nosfx=y
Collection:	Springer eBooks 2005- - Collection details see MPG.ReNa

Table of Contents:

Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects
Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults
Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm
Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm
Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization
Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model
Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits

Test Generation of Crosstalk Delay Faults in VLSI Circuits

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