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181001 ||| eng |
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|a 9789811324932
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| 100 |
1 |
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|a Jayanthy, S.
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| 245 |
0 |
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|a Test Generation of Crosstalk Delay Faults in VLSI Circuits
|h Elektronische Ressource
|c by S. Jayanthy, M.C. Bhuvaneswari
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| 250 |
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|a 1st ed. 2019
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| 260 |
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|a Singapore
|b Springer Nature Singapore
|c 2019, 2019
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| 300 |
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|a XI, 156 p. 49 illus., 7 illus. in color
|b online resource
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| 505 |
0 |
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|a Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects -- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults -- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm -- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm -- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization -- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model -- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits
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| 653 |
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|a Microprogramming
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| 653 |
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|a Hardware Performance and Reliability
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| 653 |
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|a Computers
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| 653 |
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|a Control Structures and Microprogramming
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| 653 |
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|a Electronic circuits
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| 653 |
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|a Logic design
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| 653 |
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|a Logic Design
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| 653 |
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|a Electronic Circuits and Systems
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| 700 |
1 |
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|a Bhuvaneswari, M.C.
|e [author]
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b Springer
|a Springer eBooks 2005-
|
| 856 |
4 |
0 |
|u https://doi.org/10.1007/978-981-13-2493-2?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
0 |
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|a 621.3815
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| 520 |
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|a This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing
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