Metal Impurities in Silicon- and Germanium-Based Technologies Origin, Characterization, Control, and Device Impact

This book gives a unique review of different aspects of metallic contaminations in Si and Ge-based semiconductors. All important metals are discussed including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on...

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Bibliographic Details
Main Authors: Claeys, Cor, Simoen, Eddy (Author)
Format: eBook
Language:English
Published: Cham Springer International Publishing 2018, 2018
Edition:1st ed. 2018
Series:Springer Series in Materials Science
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
LEADER 02552nmm a2200373 u 4500
001 EB001846047
003 EBX01000000000000001010552
005 00000000000000.0
007 cr|||||||||||||||||||||
008 180901 ||| eng
020 |a 9783319939254 
100 1 |a Claeys, Cor 
245 0 0 |a Metal Impurities in Silicon- and Germanium-Based Technologies  |h Elektronische Ressource  |b Origin, Characterization, Control, and Device Impact  |c by Cor Claeys, Eddy Simoen 
250 |a 1st ed. 2018 
260 |a Cham  |b Springer International Publishing  |c 2018, 2018 
300 |a XXXIII, 438 p. 215 illus., 207 illus. in color  |b online resource 
505 0 |a Preface -- Introduction -- Basic Properties of Metals in Semiconductors -- Sources of Metals in Si and Ge Processing -- Characterization and Detection of Metals in Silicon and Germanium -- Electrical Activity of Metals in Si and Ge -- Impact of Metals on Silicon Devices and Circuits -- Gettering and Passivation of Metals in Silicon and Germanium -- Modeling and Simulation of Metals in Silicon and Germanium -- Conclusions 
653 |a Semiconductors 
653 |a Electronic circuits 
653 |a Optical Materials 
653 |a Telecommunication 
653 |a Optical materials 
653 |a Electronic Circuits and Systems 
653 |a Microwaves, RF Engineering and Optical Communications 
653 |a Materials / Analysis 
653 |a Characterization and Analytical Technique 
700 1 |a Simoen, Eddy  |e [author] 
041 0 7 |a eng  |2 ISO 639-2 
989 |b Springer  |a Springer eBooks 2005- 
490 0 |a Springer Series in Materials Science 
028 5 0 |a 10.1007/978-3-319-93925-4 
856 4 0 |u https://doi.org/10.1007/978-3-319-93925-4?nosfx=y  |x Verlag  |3 Volltext 
082 0 |a 62,011,295 
520 |a This book gives a unique review of different aspects of metallic contaminations in Si and Ge-based semiconductors. All important metals are discussed including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on the electrical device performance. Several control and possible gettering approaches are addressed. The book is a reference for researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. It has an interdisciplinary nature by combining different disciplines such as material science, defect engineering, device processing, defect and device characterization and device physics and engineering