1671.5-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
Format: | eBook |
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Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc.
2012
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Subjects: | |
Online Access: | |
Collection: | IEEE Standards - Collection details see MPG.ReNa |
ISBN: | 9780738181660 |
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