1671.5-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2008
Subjects:
Online Access:
Collection: IEEE Standards - Collection details see MPG.ReNa
Description
ISBN:9780738158068