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X-Ray Microscopy and Spectromicroscopy Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996

This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instr...

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Bibliographic Details
Other Authors: Thieme, Jürgen (Editor), Schmahl, Günter (Editor), Rudolph, Dietbert (Editor), Umbach, Eberhard (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg Springer Berlin Heidelberg 1998, 1998
Edition:1st ed. 1998
Subjects:
Laser
Thin Films
Surfaces, Interfaces And Thin Film
Lasers
Crystallography
Biophysics
Surfaces (technology)
Crystallography And Scattering Methods
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
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520 |a This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies 

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