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140122 ||| eng |
020 |
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|a 9783642721069
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100 |
1 |
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|a Thieme, Jürgen
|e [editor]
|
245 |
0 |
0 |
|a X-Ray Microscopy and Spectromicroscopy
|h Elektronische Ressource
|b Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996
|c edited by Jürgen Thieme, Günter Schmahl, Dietbert Rudolph, Eberhard Umbach
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250 |
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|a 1st ed. 1998
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260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 1998, 1998
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300 |
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|a XIX, 383 p. 400 illus
|b online resource
|
505 |
0 |
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|a X-Ray Microscopy Projects -- X-Ray Microscopy Applications -- Microspectroscopy and Spectromicroscopy -- X-Ray Optics -- X-Ray Sources
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653 |
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|a Laser
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653 |
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|a Thin films
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653 |
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|a Surfaces, Interfaces and Thin Film
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653 |
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|a Lasers
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653 |
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|a Crystallography
|
653 |
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|a Biophysics
|
653 |
|
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|a Surfaces (Technology)
|
653 |
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|a Crystallography and Scattering Methods
|
700 |
1 |
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|a Schmahl, Günter
|e [editor]
|
700 |
1 |
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|a Rudolph, Dietbert
|e [editor]
|
700 |
1 |
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|a Umbach, Eberhard
|e [editor]
|
041 |
0 |
7 |
|a eng
|2 ISO 639-2
|
989 |
|
|
|b SBA
|a Springer Book Archives -2004
|
028 |
5 |
0 |
|a 10.1007/978-3-642-72106-9
|
856 |
4 |
0 |
|u https://doi.org/10.1007/978-3-642-72106-9?nosfx=y
|x Verlag
|3 Volltext
|
082 |
0 |
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|a 621.366
|
520 |
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|a This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies
|