Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps pres...

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Main Authors: Im, Seongil, Chang, Youn-Gyoung (Author), Kim, Jae Hoon (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Dordrecht Springer Netherlands 2013, 2013
Edition:1st ed. 2013
Series:SpringerBriefs in Physics
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Table of Contents:
  • Chapter 1 Device Stability and Photo-Excited Charge-Collection Spectroscopy
  • Chapter 2 Instrumentations for PECCS
  • Chapter 3 PECCS measurements in Organic FETs
  • Chapter 4 PECCS measurements in Oxide FETs
  • Chapter 5 PECCS measurements in Nanostructure FETs
  • Chapter 6 Summary and limiting factors of PECCS.