Im, S., Chang, Y., & Kim, J. H. (2013). Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors (1st ed. 2013.). Dordrecht: Springer Netherlands.
Chicago Style CitationIm, Seongil, Youn-Gyoung Chang, and Jae Hoon Kim. Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-effect Transistors. 1st ed. 2013. Dordrecht: Springer Netherlands, 2013.
MLA CitationIm, Seongil, Youn-Gyoung Chang, and Jae Hoon Kim. Photo-Excited Charge Collection Spectroscopy: Probing the Traps in Field-effect Transistors. 1st ed. 2013. Dordrecht: Springer Netherlands, 2013.
Warning: These citations may not always be 100% accurate.