Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Bibliographic Details
Other Authors: Yeung, Dit-Yan (Editor), Kwok, James T. (Editor), Fred, Ana (Editor), Roli, Fabio (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg Springer Berlin Heidelberg 2006, 2006
Edition:1st ed. 2006
Series:Image Processing, Computer Vision, Pattern Recognition, and Graphics
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
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653 |a Artificial Intelligence 
653 |a Computer Vision 
653 |a Artificial intelligence 
653 |a Discrete mathematics 
653 |a Automated Pattern Recognition 
653 |a Pattern recognition systems 
700 1 |a Kwok, James T.  |e [editor] 
700 1 |a Fred, Ana  |e [editor] 
700 1 |a Roli, Fabio  |e [editor] 
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