Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Bibliographic Details
Other Authors: Yeung, Dit-Yan (Editor), Kwok, James T. (Editor), Fred, Ana (Editor), Roli, Fabio (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg Springer Berlin Heidelberg 2006, 2006
Edition:1st ed. 2006
Series:Image Processing, Computer Vision, Pattern Recognition, and Graphics
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Description
Physical Description:XXI, 939 p online resource
ISBN:9783540372417