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1
62860-1-2013 - IEC/IEEE Test methods for the characterization of organic
transistor
-based ring oscillators
Published 2013
The Institute of Electrical and Electronics Engineers, Inc.
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2
1620.1-2006 - IEEE Standard for Test Methods for the Characterization of Organic
Transistor
-Based Ring Oscillators
Published 2006
The Institute of Electrical and Electronics Engineers, Inc.
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3
218-1956 - IEEE Standard Methods of Testing
Transistors
Published 1956
The Institute of Electrical and Electronics Engineers, Inc.
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4
1620-2004 - Standard for Test Methods for the Characterization of Organic
Transistors
and Materials
Published 2004
The Institute of Electrical and Electronics Engineers, Inc.
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5
425-1957 - AIEE Test Code for
Transistors
- Semiconductor Definitions and Letter Symbols
Published 1957
The Institute of Electrical and Electronics Engineers, Inc.
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6
62860-2013 - IEC/IEEE Test methods for the characterization of organic
transistors
and materials
Published 2013
The Institute of Electrical and Electronics Engineers, Inc.
Read Now
7
1620-2008 - IEEE Standard for Test Methods for the Characterization of Organic
Transistors
and Materials
Published 2008
The Institute of Electrical and Electronics Engineers, Inc.
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8
1620-2008 - IEEE Standard for Test Methods for the Characterization of Organic
Transistors
and Materials - Redline
Published 2008
The Institute of Electrical and Electronics Engineers, Inc.
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9
581-1978 - IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitride-Oxide Field-Effect
Transistors
Published 1978
The Institute of Electrical and Electronics Engineers, Inc.
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