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1620-2004 - Standard for Test Methods for the Characterization of Organic Transistors and Materials

Bibliographic Details
Format: eBook
Published: New York The Institute of Electrical and Electronics Engineers, Inc. 2004
Subjects:
Computing And Processing; Components, Circuits, Devices And Systems
Online Access:
https://ieeexplore.ieee.org/servlet/opac?punumber=...
Collection: IEEE Standards - Collection details see MPG.ReNa
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ISBN:9780738139937

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