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dewey-ones:"621 - Applied physics"
product_txtF_mv:"Springer Book Archives -2004"
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1
Research Perspectives and Case Studies in System Test and Diagnosis
Published 1998
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
2
Delay Fault Testing for VLSI Circuits
by
Krstic, Angela
,
Kwang-Ting (Tim) Cheng
Published 1998
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
3
Introduction to IDDQ Testing
by
Chakravarty, S.
,
Thadikaran, Paul J.
Published 1997
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
4
Defect Oriented Testing for CMOS Analog and Digital Circuits
by
Sachdev, Manoj
Published 1999
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
5
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
by
Bushnell, M.
,
Agrawal, Vishwani
Published 2002
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
6
Design for AT-Speed Test, Diagnosis and Measurement
Published 2000
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
7
High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test
by
Adams, R. Dean
Published 2003
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
8
Boundary-Scan Interconnect Diagnosis
by
Sousa, José T. de
,
Cheung, Peter Y.K.
Published 2001
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
9
A Designer’s Guide to Built-In Self-Test
by
Stroud, Charles E.
Published 2002
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
10
Associative Computing : A Programming Paradigm for Massively Parallel Computers
by
Potter, Jerry L.
Published 1992
Springer US
“
...
Frontiers
in Computer Science...
”
Read Now
11
Elements of STIL : Principles and Applications of IEEE Std. 1450
by
Maston, Gregory A.
,
Taylor, Tony R.
,
Villar, Julie N.
Published 2003
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
12
Testability Concepts for Digital ICs : The Macro Test Approach
by
Beenker, F.P.M.
,
Bennetts, R.G.
,
Thijssen, A.P.
Published 1995
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
13
Formal Equivalence Checking and Design Debugging
by
Shi-Yu Huang
,
Kwang-Ting (Tim) Cheng
Published 1998
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
14
Analog and Mixed-Signal Boundary-Scan : A Guide to the IEEE 1149.4 Test Standard
Published 1999
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
15
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
Published 2003
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
16
Power-Constrained Testing of VLSI Circuits : A Guide to the IEEE 1149.4 Test Standard
by
Nicolici, Nicola
,
Al-Hashimi, Bashir M.
Published 2003
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
17
Efficient Branch and Bound Search with Application to Computer-Aided Design
by
Xinghao Chen
,
Bushnell, Michael L.
Published 1996
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
18
Test Resource Partitioning for System-on-a-Chip
by
Iyengar, Vikram
,
Chandra, Anshuman
Published 2002
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
19
On-Line Testing for VLSI
Published 1998
Springer US
“
...
Frontiers
in Electronic Testing...
”
Read Now
20
Testing Static Random Access Memories : Defects, Fault Models and Test Patterns
by
Hamdioui, Said
Published 2004
Springer US
“
...
Frontiers
in Electronic Testing...
”
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Classification: 621 - Applied physics
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Collection: Springer Book Archives -2004
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621 - Applied physics
004 - Data processing & computer science
3
Language
English
22
Collection
Springer Book Archives -2004
Author
Kwang-Ting (Tim) Cheng
2
Tewksbury, Stuart K.
2
Adams, R. Dean
1
Agrawal, Vishwani
1
Al-Hashimi, Bashir M.
1
Beenker, F.P.M.
1
more ...
Bennetts, R.G.
1
Benso, Alfredo
1
Bushnell, M.
1
Bushnell, Michael L.
1
Chakravarty, S.
1
Chandra, Anshuman
1
Cheung, Peter Y.K.
1
Hamdioui, Said
1
Iyengar, Vikram
1
Krstic, Angela
1
Maston, Gregory A.
1
Nadeau-Dostie, Benoit
1
Nicolaidis, Michael
1
Nicolici, Nicola
1
Osseiran, Adam
1
Potter, Jerry L.
1
Pradhan, Dhiraj
1
Prinetto, Paolo
1
Sachdev, Manoj
1
Sheppard, John W.
1
Shi-Yu Huang
1
Simpson, William R.
1
Sousa, José T. de
1
Stroud, Charles E.
1
Taylor, Tony R.
1
Thadikaran, Paul J.
1
Thijssen, A.P.
1
Villar, Julie N.
1
Xinghao Chen
1
Zorian, Yervant
1
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