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Manoj Sachdev

Manoj Sachdev from the University of Waterloo, Waterloo, ON, Canada was named Fellow of the Institute of Electrical and Electronics Engineers (IEEE) in 2012 ''for contributions to test methodology for very large scale integrated circuits''. Provided by Wikipedia

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1

Defect Oriented Testing for CMOS Analog and Digital Circuits

by Sachdev, Manoj
Published 1999

Springer US

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2

Thermal and Power Management of Integrated Circuits

by Vassighi, Arman, Sachdev, Manoj
Published 2006

Springer US

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3

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test

by Pavlov, Andrei, Sachdev, Manoj
Published 2008

Springer Netherlands

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4

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

by Semenov, Oleg, Sarbishaei, Hossein, Sachdev, Manoj
Published 2008

Springer Netherlands

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5

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

by Sachdev, Manoj, Pineda de Gyvez, José
Published 2007

Springer US