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1
Published 1988
Springer Berlin Heidelberg
Table of Contents: “... of 2D Alkali Liquids in Graphite -- Microstructures of Rare-Gas Films Adsorbed on Graphite: Classical...”
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2
Published 1987
Springer Berlin Heidelberg
Table of Contents: “...Field Emission Microscopy for Analysis of Semiconductor Surfaces -- Surface and Interface Studies...”
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4
Published 1992
Springer Berlin Heidelberg
Table of Contents: “... Neutron Radiation -- Roughness Characterization of the Surface and Interface of MBE-Grown Thin Films...”
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5
Published 1997
Springer Netherlands
Subjects: “...Surfaces and Interfaces, Thin Films...”
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6
Published 1990
Springer Netherlands
Subjects: “...Surfaces and Interfaces, Thin Films...”
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7
Published 2006
Springer Netherlands
Table of Contents: “... Deconvolution on Crystals with Interfaces -- Crystal Structure Determination by Maximum Entropy Image...”
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8
Published 1998
Springer Berlin Heidelberg
Table of Contents: “... Diamond for Surface Acoustic Wave Filters -- 15. Electron Emission from CVD-Diamond Cold Cathodes -- 16...”
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9
by Evarestov, Robert A., Smirnov, Vyacheslav P.
Published 1993
Springer Berlin Heidelberg
Table of Contents: “... -- 6.2 Diperiodic Space Groups. Surface Electron States -- 7. Application of Induced Representations...”
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10
by Claeys, C., Simoen, E.
Published 2002
Springer Berlin Heidelberg
Subjects: “...Surfaces, Interfaces and Thin Film...”
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11 Table of Contents: “...methods of numerical solutions -- 4. Structure of the boundary surfaces -- 5. Adsorption...”
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12
Published 1989
Springer Berlin Heidelberg
Table of Contents: “... and Passive Electronic Applications of CVD Diamond Films -- V Surfaces and Interfaces of Silicon Carbide...”
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13
Published 1989
Springer US
Table of Contents: “... Thin Layers -- Kinematic Theory of X-ray and Neutron Scattering by Defects in Thin Films and Surface...”
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14
by Chernov, A. A.
Published 1979
Springer US
Table of Contents: “... of Au on Ag (111) -- Nucleation, Growth Processes, and Electrical Properties of Semiconductor Thin Films...”
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15
Published 1997
Springer Netherlands
Table of Contents: “... -- How to determine reliable intensities using film methods? -- Surface structures solved by direct...”