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dewey-ones:"389 - Metrology & standardization"
language:"English"
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Applications and metrology at nanometer scale, 1: Smart materials, electromagnetic waves and uncertainties
by
Dahoo, Pierre Richard
Published 2021
ISTE Ltd.
Table of Contents:
“
...Nanometer Scale --
Statistical
Tools to Reduce the Effect of Design Uncertainties...
”
Call Number:
QC88
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389 - Metrology & standardization
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El Hami, Abdelkhalak
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Pougnet, Philippe
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