Applications and metrology at nanometer scale, 1: Smart materials, electromagnetic waves and uncertainties

To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanic...

Full description

Bibliographic Details
Main Author: Dahoo, Pierre Richard
Other Authors: Pougnet, Philippe, El Hami, Abdelkhalak
Format: eBook
Language:English
Published: London ISTE Ltd. 2021
Series:Mechanical engineering and solid mechanics series
Subjects:
Online Access:
Collection: O'Reilly - Collection details see MPG.ReNa
Description
Summary:To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics. This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications. Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master's students
Physical Description:1 online resource
ISBN:9781119808244
9781119808220
1119808243