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1
Defect Oriented Testing for CMOS Analog and Digital Circuits
by
Sachdev, Manoj
Published 1999
Springer US
“
...
Frontiers
in Electronic Testing...
”
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2
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
by
Pavlov, Andrei
,
Sachdev, Manoj
Published 2008
Springer Netherlands
“
...
Frontiers
in Electronic Testing...
”
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3
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
by
Sachdev, Manoj
,
Pineda de Gyvez, José
Published 2007
Springer US
“
...
Frontiers
in Electronic Testing...
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621 - Applied physics
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006 - Special computer methods
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English
3
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Springer eBooks 2005-
2
Springer Book Archives -2004
1
Author
Sachdev, Manoj
Pavlov, Andrei
1
Pineda de Gyvez, José
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