MPG.eBooks - Search Results - "Frontiere"

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test

by Pavlov, Andrei, Sachdev, Manoj
Published 2008

Springer Netherlands

“...Frontiers in Electronic Testing...”

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2

Defect Oriented Testing for CMOS Analog and Digital Circuits

by Sachdev, Manoj
Published 1999

Springer US

“...Frontiers in Electronic Testing...”