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240502 ||| eng |
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|a 9783731513063
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|a 1000159372
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|a Uhlig, David
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|a Light Field Imaging for Deflectometry
|h Elektronische Ressource
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|b KIT Scientific Publishing
|c 2023
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300 |
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|a 1 electronic resource (284 p.)
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|a Electrical engineering / bicssc
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|a phase unwrapping; camera calibration; light field cameral Phasenentfaltung; Kamerakalibrierung; Lichtfeldkamera; surface reconstruction; deflectometry; Oberflächenrekonstruktion; Deflektometrie
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|a eng
|2 ISO 639-2
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|b DOAB
|a Directory of Open Access Books
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|a Forschungsberichte aus der Industriellen Informationstechnik
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|a Creative Commons (cc), https://creativecommons.org/licenses/by-sa/4.0/
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|a 10.5445/KSP/1000159372
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|u https://library.oapen.org/bitstream/20.500.12657/76521/1/light-field-imaging-for-deflectometry.pdf
|7 0
|x Verlag
|3 Volltext
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|u https://directory.doabooks.org/handle/20.500.12854/122156
|z DOAB: description of the publication
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|a 620
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|a Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurement of specular surfaces. It presents improvements in phase unwrapping and calibration techniques, enabling high surface reconstruction accuracies using only a single monocular light field camera.
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