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231010 ||| eng |
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|a 9783031407185
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| 100 |
1 |
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|a Eremenko, Volodymyr
|e [editor]
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| 245 |
0 |
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|a Advanced Information-Measuring Technologies and Systems I
|h Elektronische Ressource
|c edited by Volodymyr Eremenko, Artur Zaporozhets
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| 250 |
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|a 1st ed. 2024
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| 260 |
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|a Cham
|b Springer Nature Switzerland
|c 2024, 2024
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| 300 |
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|a IX, 277 p. 234 illus., 82 illus. in color
|b online resource
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| 505 |
0 |
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|a Preface -- Contents -- Metrological Support of Measurement Channels with Bridge Circuits -- Application of Exponential Splines in the Measurement and Control of Electric Circuit Parameters -- Improving of Methods of Impedance Parameters Units Reproduction and Measurement Accuracy Increasing for Ensuring Metrological Traceability -- Implementation of Information and Measurement Systems at the Base Specialized Internet Protocols -- Model of Information Signals Formation in the Diagnostics of Composite Products -- Theory and Practice of Ensuring the Validity in Testing Laboratories -- Methodology for Controlling Greenhouse Microclimate Parameters and Yield Forecast Using Neural Network Technologies
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| 653 |
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|a Engineering mathematics
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| 653 |
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|a Data Engineering
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| 653 |
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|a Engineering / Data processing
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| 653 |
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|a Mechanical engineering
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| 653 |
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|a Mechanical Engineering
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| 653 |
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|a Mathematical and Computational Engineering Applications
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| 700 |
1 |
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|a Zaporozhets, Artur
|e [editor]
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b Springer
|a Springer eBooks 2005-
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| 490 |
0 |
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|a Studies in Systems, Decision and Control
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| 028 |
5 |
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|a 10.1007/978-3-031-40718-5
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| 856 |
4 |
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|u https://doi.org/10.1007/978-3-031-40718-5?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
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|a 620
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| 520 |
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|a The book presents the main scientific directions and issues of research conducted in the Department of Information and Measurement Technologies at the National Technical University of Ukraine "Ihor Sikorskyi Kyiv Polytechnic Institute". The presented results cover almost all scientific directions related to information and measurement technologies—metrological support of measurement channels of information and measurement systems, methods of reproducing units of electric circuit parameters, development of specialized information and measurement systems, mathematical methods of processing measurement information, models of formation of information signals and fields, statistical diagnostic methods, information support of testing, and calibration laboratories
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