VLSI Design and Test 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organi...

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Bibliographic Details
Other Authors: Shah, Ambika Prasad (Editor), Dasgupta, Sudeb (Editor), Darji, Anand (Editor), Tudu, Jaynarayan (Editor)
Format: eBook
Language:English
Published: Cham Springer Nature Switzerland 2022, 2022
Edition:1st ed. 2022
Series:Communications in Computer and Information Science
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Description
Summary:This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design
Physical Description:XVIII, 596 p. 410 illus., 316 illus. in color online resource
ISBN:9783031215148