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221201 ||| eng |
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|a 9783031153457
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| 100 |
1 |
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|a Raji, Mohsen
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| 245 |
0 |
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|a Lifetime Reliability-aware Design of Integrated Circuits
|h Elektronische Ressource
|c by Mohsen Raji, Behnam Ghavami
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| 250 |
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|a 1st ed. 2023
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| 260 |
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|a Cham
|b Springer International Publishing
|c 2023, 2023
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| 300 |
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|a XIII, 107 p. 31 illus., 13 illus. in color
|b online resource
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| 505 |
0 |
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|a 1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops -- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops -- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops -- 4 Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits -- 5 Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits -- 6 Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment
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| 653 |
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|a Electronics Design and Verification
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| 653 |
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|a Embedded Systems
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| 653 |
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|a Embedded computer systems
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| 653 |
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|a Electronic circuit design
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| 653 |
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|a Electronic circuits
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| 653 |
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|a Electronic Circuits and Systems
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| 700 |
1 |
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|a Ghavami, Behnam
|e [author]
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b Springer
|a Springer eBooks 2005-
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| 028 |
5 |
0 |
|a 10.1007/978-3-031-15345-7
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| 856 |
4 |
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|u https://doi.org/10.1007/978-3-031-15345-7?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
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|a 621.3815
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| 520 |
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|a This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits; Describes state-of-the artaging- and process variation-aware CAD algorithms; Includes reliability improvement techniques for common clocked storage element
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