1838-2019 - IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
| Format: | eBook |
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| Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc.
2020
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| Subjects: | |
| Online Access: | |
| Collection: | IEEE Standards - Collection details see MPG.ReNa |
| ISBN: | 9781504463430 |
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