Atomic and Electronic Properties of 2D Moiré Interfaces

This thesis provides the first atomic length-scale observation of the structural transformation (referred to as lattice reconstruction) that occurs in moiré superlattices of twisted bilayer transition metal dichalcogenides (TMDs) at low (θ < 2˚) twist angles. Studies using Scanning transmission e...

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Bibliographic Details
Main Author: Weston, Astrid
Format: eBook
Language:English
Published: Cham Springer International Publishing 2022, 2022
Edition:1st ed. 2022
Series:Springer Theses, Recognizing Outstanding Ph.D. Research
Subjects:
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
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100 1 |a Weston, Astrid 
245 0 0 |a Atomic and Electronic Properties of 2D Moiré Interfaces  |h Elektronische Ressource  |c by Astrid Weston 
250 |a 1st ed. 2022 
260 |a Cham  |b Springer International Publishing  |c 2022, 2022 
300 |a XIV, 140 p. 91 illus., 86 illus. in color  |b online resource 
505 0 |a Outline -- Introduction to 2-Dimensional Materials and Moiré Superlattices -- Fabrication Techniques -- Characterisation Techniques -- Atomic Structure of Reconstructed Lattices of Twisted Bilayer TMDs -- Electrical Properties of Reconstructed Lattices of Twisted Bilayer TMDs -- Final Conclusions and Future Outlooks 
653 |a Thin films 
653 |a Electronics—Materials 
653 |a Optoelectronic devices 
653 |a Electronic Materials 
653 |a Optical Materials 
653 |a Surfaces, Interfaces and Thin Film 
653 |a Optoelectronic Devices 
653 |a Optical materials 
653 |a Materials—Microscopy 
653 |a Microscopy 
653 |a Surfaces (Technology) 
041 0 7 |a eng  |2 ISO 639-2 
989 |b Springer  |a Springer eBooks 2005- 
490 0 |a Springer Theses, Recognizing Outstanding Ph.D. Research 
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520 |a This thesis provides the first atomic length-scale observation of the structural transformation (referred to as lattice reconstruction) that occurs in moiré superlattices of twisted bilayer transition metal dichalcogenides (TMDs) at low (θ < 2˚) twist angles. Studies using Scanning transmission electron microscopy (STEM) were limited due to the complexity of the (atomically-thin) sample fabrication requirements. This work developed a unique way to selectively cut and re-stack monolayers of TMDs with a controlled rotational twist angle which could then be easily suspended on a TEM grid to meet the needs of the atomically thin sample requirements. The fabrication technique enabled the study of the two common stacking-polytypes including 3R and 2H (using MoS2 and WS2 as the example) as well as their structural evolution with decreasing twist-angle. Also reported is a comprehensive investigation of electronic properties using scanning probe microscopy and electrical transport measurements of the artificially-engineered structures. These and other studies highlight the unique intrinsic properties of TMDs and their potential application in the development of the next generation of optoelectronics