X-ray diffraction modern experimental techniques

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

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Bibliographic Details
Other Authors: Seeck, Oliver H. (Editor), Murphy, Bridget M. (Editor)
Format: eBook
Language:English
Published: [Singapore] Pan Stanford Publishing 2014
Subjects:
Online Access:
Collection: O'Reilly - Collection details see MPG.ReNa
Description
Summary:High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments
Physical Description:xv, 427 pages illustrations (chiefly color)
ISBN:9789814303606