Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...

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Bibliographic Details
Main Author: Shakher Pathak, Chandra
Other Authors: Kumar, Samir
Format: eBook
Language:English
Published: IntechOpen 2022
Subjects:
Online Access:
Collection: Directory of Open Access Books - Collection details see MPG.ReNa
Description
Summary:This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
Item Description:Creative Commons (cc), https://creativecommons.org/licenses/by/3.0/
Physical Description:1 electronic resource (274 p.)
ISBN:9781839682292
9781839682308
intechopen.94185
9781839682315