Testing for small-delay defects in nanoscale CMOS integrated circuits
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality is...
| Other Authors: | , |
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| Format: | eBook |
| Language: | English |
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Boca Raton
CRC Press, Taylor & Francis Group
2014
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| Series: | Devices, circuits, and systems
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| Subjects: | |
| Online Access: | |
| Collection: | O'Reilly - Collection details see MPG.ReNa |
| Summary: | Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay |
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| Physical Description: | xv, 247 pages illustrations |
| ISBN: | 143982942X 1315217813 9781439829424 |