Biological Field Emission Scanning Electron Microscopy, 2 Volume Set

The basic principle of the scanning electron microscope (SEM) is simple. An incident electron beam is brought to a focus that typically varies in size from a fraction of a centimeter in diameter down to a spot that can be smaller by a factor of thousands of times, and with an energy varying from 100...

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Bibliographic Details
Other Authors: Fleck, Roland A. (Editor), Humbel, Bruno M. (Editor)
Format: eBook
Language:English
Published: Weinheim RMS Wiley 2019, ©2019
Series:Royal Microscopical Society - John Wiley series
Subjects:
Online Access:
Collection: Wiley Online Books - Collection details see MPG.ReNa
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520 3 |a The basic principle of the scanning electron microscope (SEM) is simple. An incident electron beam is brought to a focus that typically varies in size from a fraction of a centimeter in diameter down to a spot that can be smaller by a factor of thousands of times, and with an energy varying from 100 eV or less to a maximum of 30 keV or more. Most modern SEMs will likely have, and make use of, several types of detector so as to optimally detect, capture, collect, and display other analytical and imaging modes as desired. A lanthanum hexaboride (LaB6) source can provide better performance than the conventional tungsten emitter because the LaB6 has a much lower work function (temperature). The current versions of field emission gun (FEG) SEM instruments are usually housed in an ultra‐high vacuum environment and can operate at energies from 1 keV or less and up to 30 keV or more.