|
|
|
|
LEADER |
02217nmm a2200349 u 4500 |
001 |
EB001862006 |
003 |
EBX01000000000000001026100 |
005 |
00000000000000.0 |
007 |
cr||||||||||||||||||||| |
008 |
190313 ||| eng |
020 |
|
|
|a 9781118663264
|
020 |
|
|
|a 9781118663240
|
050 |
|
4 |
|a QH212.S3
|
100 |
1 |
|
|a Fleck, Roland A.
|e [Editor]
|
245 |
0 |
0 |
|a Biological Field Emission Scanning Electron Microscopy, 2 Volume Set
|h Elektronische Ressource
|c Edited by Roland A. Fleck (Centre for Ultrastructural Imaging King’s College London United Kingdom) ; Bruno M. Humbel (Imaging Section Okinawa Institute of Science and Technology Japan)
|
260 |
|
|
|a Weinheim
|b RMS
|b Wiley
|c 2019, ©2019
|
300 |
|
|
|a xxv, 295 Seiten, xxv, 679 Seiten
|
653 |
|
|
|a scanning electron microscope
|
653 |
|
|
|a field emission gun
|
653 |
|
|
|a analytical mode
|
653 |
|
|
|a lanthanum hexaboride source
|
653 |
|
|
|a incident electron beam
|
653 |
|
|
|a imaging mode
|
700 |
1 |
|
|a Humbel, Bruno M.
|e [Editor]
|
041 |
0 |
7 |
|a eng
|2 ISO 639-2
|
989 |
|
|
|b WILOB
|a Wiley Online Books
|
490 |
0 |
|
|a Royal Microscopical Society - John Wiley series
|
028 |
5 |
0 |
|a 10.1002/9781118663233
|
776 |
|
|
|z 9781118654064
|
856 |
4 |
0 |
|u https://doi.org/10.1002/9781118663233
|x Verlag
|3 Volltext
|
082 |
0 |
|
|a 502.8/25–dc23
|
520 |
3 |
|
|a The basic principle of the scanning electron microscope (SEM) is simple. An incident electron beam is brought to a focus that typically varies in size from a fraction of a centimeter in diameter down to a spot that can be smaller by a factor of thousands of times, and with an energy varying from 100 eV or less to a maximum of 30 keV or more. Most modern SEMs will likely have, and make use of, several types of detector so as to optimally detect, capture, collect, and display other analytical and imaging modes as desired. A lanthanum hexaboride (LaB6) source can provide better performance than the conventional tungsten emitter because the LaB6 has a much lower work function (temperature). The current versions of field emission gun (FEG) SEM instruments are usually housed in an ultra‐high vacuum environment and can operate at energies from 1 keV or less and up to 30 keV or more.
|