1671.3-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
Format: | eBook |
---|---|
Published: |
New York
The Institute of Electrical and Electronics Engineers, Inc.
2018
|
Subjects: | |
Online Access: | |
Collection: | IEEE Standards - Collection details see MPG.ReNa |
ISBN: | 9781504445672 |
---|