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VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were orga...

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Bibliographic Details
Other Authors: Kaushik, Brajesh Kumar (Editor), Dasgupta, Sudeb (Editor), Singh, Virendra (Editor)
Format: eBook
Language:English
Published: Singapore Springer Nature Singapore 2017, 2017
Edition:1st ed. 2017
Series:Communications in Computer and Information Science
Subjects:
Computer Communication Networks
Computers
Computer Networks 
Computer Hardware
Processor Architectures
Microprocessors
Computer Architecture
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
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245 0 0 |a VLSI Design and Test  |h Elektronische Ressource  |b 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers  |c edited by Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh 
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653 |a Processor Architectures 
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653 |a Computer architecture 
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520 |a This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification 

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