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161103 ||| eng |
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|a 9783662486061
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| 100 |
1 |
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|a Kumar, Challa S.S.R.
|e [editor]
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| 245 |
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|a X-ray and Neutron Techniques for Nanomaterials Characterization
|h Elektronische Ressource
|c edited by Challa S.S.R. Kumar
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| 250 |
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|a 1st ed. 2016
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| 260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 2016, 2016
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| 300 |
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|a X, 830 p. 328 illus., 273 illus. in color
|b online resource
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| 505 |
0 |
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|a Synchrotron X-ray phase nano-tomography for bone tissue characterization -- 3D chemical imaging of nanoscale biological, environmental, and synthetic materials by soft X-ray STXM spectro-tomography -- X-ray photon correlation spectroscopy for the characterization of soft and hard condensed matter -- XAFS for characterization of nanomaterials -- The characterization of atomically precise nano clusters using X-ray absorption spectroscopy -- X-ray absorption spectroscopic characterization of nanomaterial catalysts in electrochemistry and fuel cells -- In situ SXS and XAFS measurements of electrochemical interface -- Gas-phase near-edge X-ray absorption fine structure (NEXAFS) spectroscopy of nanoparticles, biopolymers, and ionic species -- In situ X-ray reciprocal space mapping for characterization of nanomaterials -- X-ray powder diffraction characterization of nanomaterials -- X-ray absorption fine structure analysis of catalytic nanomaterials -- Contribution of small angle X-ray andneutron scattering (SAXS & SANS) to the characterization of natural nano-materials -- Synchrotron small-angle X-ray scattering and small-angle neutron scattering studies of nanomaterials -- Quasi-elastic neutron scattering: An advanced technique for studying the relaxation processes in condensed matter
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| 653 |
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|a Spectrum analysis
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| 653 |
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|a Spectroscopy
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| 653 |
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|a Nanotechnology
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|a eng
|2 ISO 639-2
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| 989 |
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|b Springer
|a Springer eBooks 2005-
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| 028 |
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|a 10.1007/978-3-662-48606-1
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| 856 |
4 |
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|u https://doi.org/10.1007/978-3-662-48606-1?nosfx=y
|x Verlag
|3 Volltext
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|a 620.5
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| 520 |
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|a Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry
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