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180413 ||| eng |
| 020 |
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|a 9780191749322
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| 050 |
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4 |
|a QH212.E4
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| 100 |
1 |
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|a Spence, John C. H.
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| 245 |
0 |
0 |
|a High-resolution electron microscopy
|h Elektronische Ressource
|c John C.H. Spence, Department of Physics and Astronomy, Arizona State University/LBNL California
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| 250 |
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|a Fourth edition
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| 260 |
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|a Oxford
|b Oxford University Press
|c 2013, 2013
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| 300 |
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|a xix, 406 pages, 4 unnumbered pages of plates
|b illustrations (black and white, and colour)
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| 505 |
0 |
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|a Includes bibliographical references and index
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| 653 |
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|a Electron microscopy
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b OUP
|a Oxford University Press
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| 500 |
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|a Previous edition: 2009
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| 856 |
4 |
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|u http://dx.doi.org/10.1093/acprof:oso/9780199668632.001.0001?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
0 |
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|a 502.825
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| 520 |
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|a In the 4th edition, applications sections have been updated including the semiconductor industry, superconductor research solid state chemistry and nanoscience, and metallurgy mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography aberration correction, field-emission guns, imaging filters super-resolution methods, Ptychography, Ronchigrams, tomography image quantification and simulation, and more
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