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Circuit Design for Reliability

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ran...

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Bibliographic Details
Other Authors: Reis, Ricardo (Editor), Cao, Yu (Editor), Wirth, Gilson (Editor)
Format: eBook
Language:English
Published: New York, NY Springer New York 2015, 2015
Edition:1st ed. 2015
Subjects:
Security Science And Technology
Computer-aided Engineering (cad, Cae) And Design
Security Systems
Electronic Circuits
Computer-aided Engineering
Electronic Circuits And Systems
Online Access:
Collection: Springer eBooks 2005- - Collection details see MPG.ReNa
Table of Contents:
  • Introduction
  • Recent Trends in Bias Temperature Instability
  • Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability
  • Atomistic Simulations on Reliability
  • On-chip characterization of statistical device degradation
  • Circuit Resilience Roadmap
  • Layout Aware Electromigration Analysis of Power/Ground Networks
  • Power-Gating for Leakage Control and Beyond
  • Soft Error Rate and Fault Tolerance Techniques for FPGAs

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