SOC Design Methodologies IFIP TC10 / WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on-Chip (VLSI-SOC’01) December 3–5, 2001, Montpellier, France

The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was about IP Cores, Circuits and System Designs & Applications as well as SOC Design Methods and CAD. This book contains the best papers (39 amo...

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Bibliographic Details
Other Authors: Robert, Michel (Editor), Rouzeyre, Bruno (Editor), Piguet, Christian (Editor), Flottes, Marie-Lise (Editor)
Format: eBook
Language:English
Published: New York, NY Springer US 2002, 2002
Edition:1st ed. 2002
Series:IFIP Advances in Information and Communication Technology
Subjects:
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
Table of Contents:
  • Architecture for Signal & Image Processing
  • Two ASIC for Low and Middle Levels of Real Time Image Processing
  • 64 × 64 Pixels General Purpose Digital Vision Chip
  • A Vision System on Chip for Industrial Control
  • Fast Recursive Implementation of the Gaussian Filter
  • Dynamically Re-configurable Architectures
  • A Dynamically Reconfigurable Architecture for Low-Power Multimedia Terminals
  • Dynamically Reconfigurable Architectures for Digital Signal Processing Applications
  • Reconfigurable Architecture Using High Speed FPGA
  • CAD Tools
  • Design Technology for Systems-on-Chip
  • Distributed Collaborative Design over Cave2 Framework
  • High Performance Java Hardware Engine and Software Kernel for Embedded Systems
  • An Object-Oriented Methodology for Modeling the Precise Behavior of Processor Architectures
  • Interconnect Capacitance Modelling in a VDSM CMOS Technology
  • IP Design & Reuse
  • Abstract Communication Model and Automatic Interface generation for IP integration in Hardware/Software Co-design
  • An Evolutionary Approach for Pareto-optimal Configurations in SOC Platforms
  • Design of a Branch-Based Carry-Select Adder IP Portable in 0.25 ?m Bulk and Silicon-On-Insulator CMOS Technologies
  • High Level Design Methodologies
  • A Standardized Co-simulation Backbone
  • Automatic Code-Transformation and Architecture Refinement for Application-Specific Multiprocessor SoCs with Shared Memory
  • Power Issues
  • Modeling Power Dynamics for an Embedded DSP Processor Core. An Empirical Model
  • Power Consumption Model for the DSP OAK Processor
  • Design for Specific Constraints
  • Integration of Robustness in the Design of a Cell
  • Impact of Technology Spreading on MEMS design Robustness
  • Architectures
  • A New Efficient VLSI Architecture for Full Search Block Matching Motion Estimation.-Design Considerations of a Low-Complexity, Low-Power Integer Turbo Decoder
  • Random Adjacent Sequences: An Efficient Solution for Logic BIST
  • On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST
  • Built-in Test of Analog Non-Linear Circuits in a SOC Environment
  • Sensors
  • Design of a Fast CMOS APS Imager for High Speed Laser Detections
  • Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing
  • Authors Index
  • Keywords Index
  • Low Power, Low Voltage
  • Low-Voltage Embedded-RAM Technology: Present and Future
  • Low-Voltage 0,25 ?m CMOS Improved Power Adaptive Issue Queue for Embedded Microprocessors
  • Gate Sizing for Low Power Design
  • Timing Issues
  • Modeling and Design of Asynchronous Priority Arbiters for On-Chip Communication Systems
  • Feasible Delay Bound Definition
  • Advance in Mixed Signal
  • CMOS Mixed-signal Circuits Design on a Digital Array Using Minimum Transistors
  • A VHDL-AMS Case Study: The Incremental Design of an Efficient 3rd Generation MOS Model of a Deep Sub Micron Transistor
  • Verification & Validation
  • Speeding Up Verification of RTL Designs by Computing One-to-one Abstractions with Reduced Signal Widths
  • Functional Test Generation using Constraint Logic Programming
  • Test
  • An Industrial Approach to Core-Based System Chip Testing
  • Power-Constrained Test Scheduling for SoCs Under a “no session” Scheme