Probabilistic fracture mechanics and reliability

With the advent of the 80's there has been an increasing need for analytic and numerical techniques, based on a thorough understanding of microstructural processes, that express in a manner suitable for practicing engineers the reliability of components and structures that are being subjected t...

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Bibliographic Details
Other Authors: Provan, J.W. (Editor)
Format: eBook
Language:English
Published: Dordrecht Springer Netherlands 1987, 1987
Edition:1st ed. 1987
Series:Engineering Applications of Fracture Mechanics
Subjects:
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
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245 0 0 |a Probabilistic fracture mechanics and reliability  |h Elektronische Ressource  |c edited by J.W. Provan 
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260 |a Dordrecht  |b Springer Netherlands  |c 1987, 1987 
300 |a XV, 467 p  |b online resource 
505 0 |a 1. Probabilistic approaches to the material-related reliability of fracture-sensitive structures -- 2. Probabilistic damage tolerance analysis of aircraft structures -- 3. Aircraft structural reliability and risk analysis -- 4. Stochastic crack growth models for applications to aircraft structures -- 5. Durability of aircraft structures -- 6. The reliability of pressurized water reactor vessels -- 7. Applications of PFM in the nuclear industry to reactor pressure vessel, main coolant piping and steel containment -- 8. Numerical methods in probabilistic fracture mechanics -- 9. Probabilistic fracture mechanics -- References 
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520 |a With the advent of the 80's there has been an increasing need for analytic and numerical techniques, based on a thorough understanding of microstructural processes, that express in a manner suitable for practicing engineers the reliability of components and structures that are being subjected to degradation situations. Such situations fall within the framework offracture mechanics, fatigue, corrosion fatigue and pitting corrosion. Luckily, such techniques are now being developed and it was felt timely to combine in one volume reports by the leaders in this field who are currently making great strides towards solving these problems. Hence the idea of this monograph was born and I am pleased to be associated both with it and the contributors whose chapters are included in this volume. A very large part of the credit for this monograph must go to the authors who have taken time out from their busy schedules to prepare their submissions. They have all worked diligently over the last few months in order to get their manuscripts to me on time and I sincerely thank them for their help throughout the preparation of this volume