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140122 ||| eng |
| 020 |
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|a 9783662215791
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| 100 |
1 |
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|a Reimer, Ludwig
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| 245 |
0 |
0 |
|a Transmission Electron Microscopy
|h Elektronische Ressource
|b Physics of Image Formation and Microanalysis
|c by Ludwig Reimer
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| 250 |
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|a 2nd ed. 1989
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| 260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 1989, 1989
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| 300 |
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|a XIII, 547 p. 127 illus
|b online resource
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| 505 |
0 |
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|a 1. Introduction -- 2. Particle Optics of Electrons -- 3. Wave Optics of Electrons -- 4. Elements of a Transmission Electron Microscope -- 5. Electron-Specimen Interactions -- 6. Scattering and Phase Contrast for Amorphous Specimens -- 7. Kinematical and Dynamical Theory of Electron Diffraction -- 8. Diffraction Contrast and Crystal-Structure Imaging -- 9. Analytical Electron Microscopy -- 10. Specimen Damage by Electron Irradiation -- References
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| 653 |
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|a Spectroscopy and Microscopy
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| 653 |
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|a Spectroscopy
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| 653 |
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|a Solid State Physics
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| 653 |
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|a Biological physics
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| 653 |
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|a Microscopy
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| 653 |
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|a Biophysics
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| 653 |
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|a Biological and Medical Physics, Biophysics
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| 653 |
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|a Solid state physics
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b SBA
|a Springer Book Archives -2004
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| 490 |
0 |
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|a Springer Series in Optical Sciences
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| 856 |
4 |
0 |
|u https://doi.org/10.1007/978-3-662-21579-1?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
0 |
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|a 530.41
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| 520 |
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|a The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy
|