Adaptive Bayes’sche Stichprobensysteme für die Gut-Schlecht-Prüfung

Bibliographic Details
Main Authors: Rendtel, Ulrich, Lenz, Hans-Joachim (Author)
Format: eBook
Language:German
Published: Heidelberg Physica 1990, 1990
Edition:1st ed. 1990
Series:Arbeiten zur Angewandten Statistik
Subjects:
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
Description
Physical Description:IX, 231 S. online resource
ISBN:9783662110270