Nanoscale Characterisation of Ferroelectric Materials Scanning Probe Microscopy Approach
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferr...
| Other Authors: | , |
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| Format: | eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2004, 2004
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| Edition: | 1st ed. 2004 |
| Series: | NanoScience and Technology
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| Subjects: | |
| Online Access: | |
| Collection: | Springer Book Archives -2004 - Collection details see MPG.ReNa |
Table of Contents:
- 1 Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces
- 2 Challenges in the Analysis of the Local Piezoelectric Response
- 3 Electrical Characterization of Nanoscale Ferroelectric Structures
- 4 Nanoscale Optical Probes of Ferroelectric Materials
- 5 Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Polarization
- 6 Nanoscale Piezoelectric Phenomena in Epitaxial PZT Thin Films
- 7 Scanning Probe Microscopy of Ferroelectric Domains near Phase Transitions
- 8 Nanodomain Engineering in Ferroelectric Crystals Using High Voltage Atomic Force Microscopy
- 9 Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in PZT Thin Films