Secondary Ion Mass Spectrometry SIMS IV Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983
This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the auspices of the international organizing c...
| Other Authors: | , , , |
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| Format: | eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1984, 1984
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| Edition: | 1st ed. 1984 |
| Series: | Springer Series in Chemical Physics
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| Subjects: | |
| Online Access: | |
| Collection: | Springer Book Archives -2004 - Collection details see MPG.ReNa |
Table of Contents:
- I Fundamentals
- II Quantification
- III Instrumentation
- IV Combined and Static SIMS
- V Application to Semiconductor and Depth Profiling
- VI Organic SIMS
- VII Application
- Metallic and Inorganic Materials
- Geology
- Biology
- Index of Contributors