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140122 ||| eng |
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|a 9783642801181
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| 100 |
1 |
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|a Wiesendanger, Roland
|e [editor]
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| 245 |
0 |
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|a Scanning Tunneling Microscopy III
|h Elektronische Ressource
|b Theory of STM and Related Scanning Probe Methods
|c edited by Roland Wiesendanger, Hans-Joachim Güntherodt
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| 250 |
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|a 2nd ed. 1996
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| 260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 1996, 1996
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| 300 |
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|a XV, 402 p. 26 illus., 3 illus. in color
|b online resource
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|a 5.2 Formalism of Theoretical Simulation of STM/STS -- 5.3 Simulation of STM/STS of the Graphite Surface -- 5.4 STM/STS of Si(100) Reconstructed Surfaces -- 5.5 The Negative-Differential Resistance Observed on the Si(111)
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|a 1. Introduction -- 1.1 Theoretical Concepts for Scanning Tunneling Microscopy -- 1.2 Theoretical Concepts for Force Microscopy -- References -- 2. STM Imaging of Single-Atom Adsorbates on Metals -- 2.1 Tunneling Hamiltonian Approach -- 2.2 Adsorbates on Metal Surfaces -- 2.3 Close Approach of the Tip: The Strong-Coupling Regime -- References -- 3. The Scattering Theoretical Approach to the Scanning Tunneling Microscope -- 3.1 The Theoretical Formalism -- 3.2 Tunneling Through Thick Organic Layers -- 3.3 Scanning Tunneling Microscopy at Metal Surface -- 3.4 Summary and Conclusions -- References -- 4. Spectroscopic Information in Scanning Tunneling Microscopy -- 4.1 Green’s Function Method -- 4.2 Derivation of the Transfer Hamiltonian Approach -- 4.3 One-Dimensional Models -- 4.4 Three-Dimensional Models -- 4.5 Conclusion -- References -- 5. The Role of Tip Atomic and Electronic Structure in Scanning Tunneling Microscopy and Spectroscopy -- 5.1 Background --
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| 653 |
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|a Spectrum analysis
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| 653 |
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|a Engineering
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| 653 |
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|a Thin films
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| 653 |
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|a Condensed Matter Physics
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| 653 |
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|a Spectroscopy
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| 653 |
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|a Surfaces, Interfaces and Thin Film
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| 653 |
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|a Technology and Engineering
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| 653 |
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|a Surfaces (Technology)
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| 653 |
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|a Condensed matter
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| 700 |
1 |
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|a Güntherodt, Hans-Joachim
|e [editor]
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| 041 |
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7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b SBA
|a Springer Book Archives -2004
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| 490 |
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|a Springer Series in Surface Sciences
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| 028 |
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|a 10.1007/978-3-642-80118-1
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| 856 |
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|u https://doi.org/10.1007/978-3-642-80118-1?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
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|a 530.41
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| 520 |
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|a Scanning Tunneling Microscopy III provides a unique introduction to the theoretical foundations of scanning tunneling microscopy and related scanning probe methods. The different theoretical concepts developed in the past are outlined, and the implications of the theoretical results for the interpretation of experimental data are discussed in detail. Therefore, this book serves as a most useful guide for experimentalists as well as for theoreticians working in the filed of local probe methods. In this second edition the text has been updated and new methods are discussed
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