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140122 ||| eng |
| 020 |
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|a 9783540466147
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| 100 |
1 |
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|a Moreno, Fernando
|e [editor]
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| 245 |
0 |
0 |
|a Light Scattering from Microstructures
|h Elektronische Ressource
|b Lectures of the Summer School of Laredo, University of Cantabria, Held at Laredo, Spain, Sept.11-13, 1998
|c edited by Fernando Moreno, Francisco Gonzales
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| 250 |
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|a 1st ed. 2000
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| 260 |
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|a Berlin, Heidelberg
|b Springer Berlin Heidelberg
|c 2000, 2000
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| 300 |
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|a XII, 300 p. 121 illus
|b online resource
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| 505 |
0 |
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|a Light scattering by submicron spherical particles on semiconductor surfaces -- to Light Scattering from Microstructures -- Theory -- Heaviside Operational Calculus and Electromagnetic Image Theory -- Mathematical Methods for Data Inversion -- Mueller Matrices -- Scattering by Particles on Substrates. Numerical Methods -- Light Scattering from a Sphere Near a Plane Interface -- Electromagnetic Scattering by Cylindrical Objects on Generic Planar Substrates: Cylindrical-Wave Approach -- T-Matrix Method for Light Scattering from a Particle on or Near an Infinite Surface -- Scattering of Polarized Light -- Properties of a Polarized Light-Beam Multiply Scattered by a Rayleigh Medium -- Polarization and Depolarization of Light -- Statistics of the Scattered Light -- Polarisation Fluctuations in Light Scattered by Small Particles -- Intensity Statistics of the Light Scattered by Particles on Surfaces -- Applications -- Microstructures in Rough Metal Surfaces: Electromagnetic Mechanism in Surface-Enhanced Raman Spectroscopy -- Light Scattering by Particles and Defects on Surfaces: Semiconductor Wafer Inspection -- From Scattering to Waveguiding: Photonic Crystal Fibres -- The Angular Distribution of Light Emitted by Sonoluminescent Bubbles -- Light Scattering by Regular Particles on Flat Substrates
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| 653 |
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|a Spectrum analysis
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| 653 |
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|a Physics and Astronomy
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| 653 |
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|a Condensed Matter Physics
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| 653 |
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|a Spectroscopy
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| 653 |
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|a Physics
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| 653 |
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|a Nanotechnology
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| 653 |
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|a Astronomy
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| 653 |
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|a Condensed matter
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| 700 |
1 |
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|a Gonzales, Francisco
|e [editor]
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| 041 |
0 |
7 |
|a eng
|2 ISO 639-2
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| 989 |
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|b SBA
|a Springer Book Archives -2004
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| 490 |
0 |
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|a Lecture Notes in Physics
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| 028 |
5 |
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|a 10.1007/3-540-46614-2
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| 856 |
4 |
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|u https://doi.org/10.1007/3-540-46614-2?nosfx=y
|x Verlag
|3 Volltext
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| 082 |
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|a 620.5
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| 520 |
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|a With a tutorial approach, this book covers the most impor- tant aspects of the scattering of electromagnetic radiation from structures (isolated or on a substrate) whose size is comparable to the incident wavelength. Special emphasis is placed on the electromagnetic problem of microstructures lo- cated close to an interface by reviewing the most important numerical methods for calculating the scattered field. The polarization propagation and the statistics of scattered in- tensity in microstructured targets are also presented from a didactic point of view. The final part of the book is dedi- cated to the most significant applications in both basic and applied research: surface enhanced Raman scattering, monito- ring and detection of surface contamination by particles, optical communications, particle sizing and others
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