Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials

Bibliographic Details
Main Author: Waseda, Y.
Format: eBook
Language:English
Published: Berlin, Heidelberg Springer Berlin Heidelberg 1984, 1984
Edition:1st ed. 1984
Series:Lecture Notes in Physics
Subjects:
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
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245 0 0 |a Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials  |h Elektronische Ressource  |c by Y. Waseda 
250 |a 1st ed. 1984 
260 |a Berlin, Heidelberg  |b Springer Berlin Heidelberg  |c 1984, 1984 
300 |a VI, 186 p  |b online resource 
505 0 |a A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects 
653 |a Mineralogy 
653 |a Crystallography and Scattering Methods 
653 |a Materials science 
653 |a Mineralogy 
653 |a Materials Science, general 
653 |a Crystallography 
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989 |b SBA  |a Springer Book Archives -2004 
490 0 |a Lecture Notes in Physics 
856 4 0 |u https://doi.org/10.1007/BFb0025745?nosfx=y  |x Verlag  |3 Volltext 
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