Advanced Scanning Electron Microscopy and X-Ray Microanalysis
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to...
| Main Authors: | , , , |
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| Format: | eBook |
| Language: | English |
| Published: |
New York, NY
Springer US
1986, 1986
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| Edition: | 1st ed. 1986 |
| Subjects: | |
| Online Access: | |
| Collection: | Springer Book Archives -2004 - Collection details see MPG.ReNa |
Table of Contents:
- 1. Modeling Electron Beam-Specimen Interactions
- 2. SEM Microcharacterization of Semiconductors
- 3. Electron Channeling Contrast in the SEM
- 4. Magnetic Contrast in the SEM
- 5. Computer-Aided Imaging and Interpretation
- 6. Alternative Microanalytical Techniques
- 7. Specimen Coating
- 8. Advances in Specimen Preparation for Biological SEM
- 9. Cryomicroscopy
- References