Analog Layout Generation for Performance and Manufacturability

In the past, automatic analog layout tools tried to optimize the layout without quantifying the performance degradation introduced by layout parasitics. Therefore, it was not guaranteed that the resulting layout met the specifications and one or more layout iterations could be needed. In Analog Layo...

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Bibliographic Details
Main Authors: Lampaert, Koen, Gielen, Georges (Author), Sansen, Willy M.C. (Author)
Format: eBook
Language:English
Published: New York, NY Springer US 1999, 1999
Edition:1st ed. 1999
Series:The Springer International Series in Engineering and Computer Science
Subjects:
Online Access:
Collection: Springer Book Archives -2004 - Collection details see MPG.ReNa
LEADER 04208nmm a2200349 u 4500
001 EB000631902
003 EBX01000000000000001348800
005 00000000000000.0
007 cr|||||||||||||||||||||
008 140122 ||| eng
020 |a 9781475745016 
100 1 |a Lampaert, Koen 
245 0 0 |a Analog Layout Generation for Performance and Manufacturability  |h Elektronische Ressource  |c by Koen Lampaert, Georges Gielen, Willy M.C. Sansen 
250 |a 1st ed. 1999 
260 |a New York, NY  |b Springer US  |c 1999, 1999 
300 |a XV, 175 p  |b online resource 
505 0 |a 1 Introduction -- 2 Performance Driven Layout of Analog Integrated Circuits -- 3 Module Generation -- 4 Placement -- 5 Routing -- 6 Implementation -- 7 General Conclusions 
653 |a Electrical and Electronic Engineering 
653 |a Electrical engineering 
653 |a Electronic circuits 
653 |a Electronic Circuits and Systems 
700 1 |a Gielen, Georges  |e [author] 
700 1 |a Sansen, Willy M.C.  |e [author] 
041 0 7 |a eng  |2 ISO 639-2 
989 |b SBA  |a Springer Book Archives -2004 
490 0 |a The Springer International Series in Engineering and Computer Science 
028 5 0 |a 10.1007/978-1-4757-4501-6 
856 4 0 |u https://doi.org/10.1007/978-1-4757-4501-6?nosfx=y  |x Verlag  |3 Volltext 
082 0 |a 621.3815 
520 |a In the past, automatic analog layout tools tried to optimize the layout without quantifying the performance degradation introduced by layout parasitics. Therefore, it was not guaranteed that the resulting layout met the specifications and one or more layout iterations could be needed. In Analog Layout Generation for Performance and Manufacturability, the authors propose a performance driven layout strategy to overcome this problem. In this methodology, the layout tools are driven by performance constraints, such that the final layout, with parasitic effects, still satisfies the specifications of the circuit. The performance degradation associated with an intermediate layout solution is evaluated at runtime using predetermined sensitivities. In contrast with other performance driven layout methodologies, the tools proposed in this book operate directly on the performance constraints, without an intermediate parasitic constraint generation step.  
520 |a Analog integrated circuits are very important as interfaces between the digital parts of integrated electronic systems and the outside world. A large portion of the effort involved in designing these circuits is spent in the layout phase. Whereas the physical design of digital circuits is automated to a large extent, the layout of analog circuits is still a manual, time-consuming and error-prone task. This is mainly due to the continuous nature of analog signals, which causes analog circuit performance to be very sensitive to layout parasitics. The parasitic elements associated with interconnect wires cause loading and coupling effects that degrade the frequency behaviour and the noise performance of analog circuits. Device mismatch and thermal effects put a fundamental limit on the achievable accuracy of circuits. For successful automation of analog layout, advanced place and route tools that can handle these critical parasitics are required.  
520 |a This approach makes a completeand sensible trade-off between the different layout alternatives possible at runtime and therefore eliminates the possible feedback route between constraint derivation, placement and layout extraction. Besides its influence on the performance, layout also has a profound impact on the yield and testability of an analog circuit. In Analog Layout Generation for Performance and Manufacturability, the authors outline a new criterion to quantify the detectability of a fault and combine this with a yield model to evaluate the testability of an integrated circuit layout. They then integrate this technique with their performance driven routing algorithm to produce layouts that have optimal manufacturability while still meeting their performance specifications. Analog Layout Generation for Performance and Manufacturability will be of interest to analog engineers, researchers and students